Technical Program - Workshop
WS1A Introduction to Advanced Materials Measurements
Room
Room A (Tachibana)
Date and Time
2014/11/4 (Tue) 10:30-17:30 (Full day)
Organizers
Michael Janezic, NIST, U.S.A.
Shelley Begley, Keysight Technologies, U.S.A.
Masahiro Horibe, NMIJ-AIST, JAPAN
Abstract
The purpose of this full-day workshop is to provide an overview and demonstration of the state-of-the-art techniques used to measure the dielectric permittivity and permeability properties of materials that are widely incorporated into microwave devices and components. The first half of the workshop, tutorial in nature, will provide a framework for selecting the appropriate measurement technique and will overview the most relevant techniques for accurately measuring low-loss and high-loss solid and liquid dielectric materials at microwave, millimeter-wave frequencies and above. In the second half of the workshop, attendees will have an opportunity to see and operate many of these techniques demonstrated in an interactive laboratory-like environment, where the practical details of dielectric permittivity and permeability measurements will be emphasized.
Time Table
| 01 | 10:30 | Introduction to Dielectric Measurements |
|---|---|---|
| Mike Janezic, NIST, U.S.A. | ||
| 02 | 11:00 | Measurement Techniques of Dielectric Substrates for Microwave and Millimeter Wave Circuits by Resonator Methods |
| Takashi Shimizu, Utsunomiya Univ., JAPAN | ||
| 03 | 11:25 | Liquid Measurements Using and Open-Ended Coaxial Probe |
| Shelly Begley, Keysight Technologies, U.S.A. | ||
| 12:00 | Lunch Break | |
| 04 | 13:00 | Evaluation of Frequency-Dependent Characteristics by Harmonic Resonance Cavity Perturbation Method |
| Taro Miura, The Mueller Consultant, JAPAN, Ken Tahara, KEAD, JAPAN | ||
| 05 | 13:25 | Millimeter-Wave Measurements: Broadband Quasi-Optical Techniques |
| Masahiro Horibe, NMIJ-AIST, JAPAN | ||
| 06 | 13:40 | Millimeter-Wave Material Characterization Using On-Wafer Techniques |
| Uwe Arz, PTB, GERMANY | ||
| 07 | 14:00 | Permeability Measurement System Up to 9GHz |
| Ryowa Electronics Co, Ltd., JAPAN | ||
| 08 | 14:25 | Meta-Material Measurement Using Freespace S-Parameter Method |
| Yoshihiko Todaka, Keysight Technologies, JAPAN | ||
| 09 | 14:50 | Application Measurements for Agriculture Products |
| Monai Krairiksh, KMITL, THAILAND | ||
| Round Table Discussion | ||
| 15:10 | Break | |
| 10 | 15:30 | Hans-on Demonstrations Supported by Keysight Technologies |
|
- Balanced-Type Circular Disk Resonator (SUMTEC Inc., JAPAN) - Liquid Measurements Using and Open-Ended Coaxial Probe (Keysight Technologies, JAPAN) - Quasi-Optical Techniques (AIST, JAPAN) - Harmonic Permeability Measurement (KEAD, JAPAN) - Magnetic Permeability Measurements (Ryowa Electric Co, Ltd., JAPAN) |
||
| 17:25 | Closing |
WS1B Introduction to Theory of Operation and Reliabilityin Vector Network Analyzer Measurement at RF, Microwave and Millimeter-Wave Frequencies
Room
Room B (Hagi)
Date and Time
2014/11/4 (Tue) 09:30-16:30 (Full day)
Organizers
Masahiro Horibe, AIST, JAPAN
Dominique Schreurs, KU Leuven, BELGIUM
Sponsorship
IEEE MTT-11 Microwave Measurements
Abstract
Following recent successful workshops on uncertainties and measurement traceability in microwaveand millimeter-wavemeasurements, from Asia-Pacific Microwave Conference 2009 (titled, ″Establishing Confidence in Microwave Measurements″) and several workshops in Microwave Week and European Microwave Week, this workshop will continue presenting more practical and fundamental information on evaluating accuracy of measurements made at RF, microwave and millimeter-wave frequencies. In particularcase, this workshop will give some knowledge for establishing reliable measurement with broad-band frequency range. This will concentrate on the fundamental measurement techniques and somewhat application measurement solutions at these frequencies -S-parameter, non-linear network analysis andon-wafer. The workshop will conclude with a roundtable discussion reviewing all talks around reliable measurements that are currently required, and in the coming few years.
Time Table
| 01 | 09:30 | Overviews : Requests of Reliable Measurements from Industrial and Scientific Fields |
|---|---|---|
| Masahiro Horibe, NMIJ-AIST, JAPAN | ||
| 02 | 09:35 | Standard and VNA Evaluation at Millimeter Wave and FR |
| Masahiro Horibe and Anton Widarta, NMIJ-AIST, JAPAN | ||
| 03 | 09:55 | Six-Port Network Analysis |
| Toshiyuki Yakabe, Electric Telecommunication Univ., JAPAN | ||
| 04 | 10:20 | Connectorized (Millimeter-Wave) S-Parameter Measurements |
| Jon Martens, Anritsu Company, U.S.A. | ||
| 05 | 11:10 | Calibration and System Verification in VNA Measurements |
| Ken Wong, Keysight Technologies, U.S.A. | ||
| 12:00 | Lunch Break | |
| 06 | 13:00 | Measurement Uncertainty and Vector Network Analysis |
| Blair Hall, MSL, NEW ZEALAND | ||
| 07 | 13:40 | S-Parameter Multiport Uncertainty : From the Theory to a Useful Tool |
| Andrea Ferrero, Keysight Technologies, SWITZERLAND | ||
| 14:30 | Break | |
| 08 | 14:40 | Strategies for RF Probe Calibrations - Catering to Applications up to 500GHz |
| Choon Beng Sia, Cascade Microtech Singapore, Pte., Ltd., SINGAPORE | ||
| 09 | 15:05 | Understanding and Dealing with Calibration Residual Errors at the Wafer-Level |
| Andrej Rumiantsev, MPI, GERMANY | ||
| 10 | 15:30 | Towards Greener Smartphones with Microwave Measurements |
| Dominique Schreurs, KULeuven, BELGIUM | ||
| 16:20 | Discussion and Closing |
WS1C Trend of New Wide Band Gap Materials and Devices for Next Innovation
Room
Room C (Shirakashi 1)
Date and Time
2014/11/4 (Tue) 10:30-17:30 (Full day)
Organizers
Toshihide Kikkawa, Transphorm Japan, Inc., JAPAN
Kazuya Yamamoto, Mitsubishi Electric Corp., JAPAN
Abstract
This workshop covers new wide band-gap materilas and devices. trend and future of GaN, SiC GaO, ZnO, Diamond, and GaN on Diamond will be presented for next innovation. This workshop will expand the dedicated application area. Power application or new application will be included in addition to RF application. Firstly, GaN and SiC will be compared for power application. Then, Oxide-based materials as the next new materials will be introduced to the attendees to understand current device level. Diamond and GaN on Diamond will be reviewed Considering the thermal management. Finally, GaN reliability status and RF application trend will be summarized to compare with other materials.
Time Table
| 00 | 10:30 | Introduction of Wide Band Gap Materials for Future Inovation |
|---|---|---|
| Toshihide Kikkawa, Transphorm Japan, JAPAN | ||
| 01 | 10:35 | 200mm GaN-on-Si Status : Comparison of e-Mode p-GaN and Recessed MISHEMT Devices |
| Denis Marcon, Marleen Van Hove, Brice De Jaeger, Dirk Wellekens, Niels Posthuma, Shuzhen You, Benoit Bakeroot, Xuanwu Kang, Tian-Li Wu, Maarten Willems, Steve Stoffels and Stefaan Decoutere, IMEC, BELGIUM | ||
| 02 | 11:15 | SiC Devices - Current Status and Future - |
| Tsunenobu Kimoto, Kyoto Univ., JAPAN | ||
| 11:55 | Break | |
| 03 | 12:10 | Gallium Oxide (Ga2O3) Devices for Next Generation Applications |
| Masataka Higashiwaki1, Kohei Sasaki1,2, Takafumi Kamimura1, Man Hoi Wong1,
Daivasigamani Krishnamurthy1, Akito Kuramata2, Takekazu Masui3, and Shigenobu Yamakoshi2, 1: NICT, JAPAN, 2: Tamura Corp., JAPAN, 3: Koha Co. Ltd., JAPAN |
||
| 04 | 12:50 | ZnO Devices : Current and Future |
| Shigehiko Sasa, M. Yano, K. Koike, T. Maemoto,, K. Ogata, Osaka Inst. Tech., JAPAN | ||
| 13:30 | Lunch | |
| 05 | 14:30 | Diamond Electronic Devices for Future Application |
| Yasuo Koide, NIMS, JAPAN | ||
| 06 | 15:10 | CVD Diamond for Enhanced GaN Devices |
| Bruce Bolliger, Felix Ejeckam, Joe Dodson, Firooz Faili, Dan Francis, Frank Lowe, Daniel Twitchen, Element Six, U.S.A. | ||
| 15:50 | Break | |
| 07 | 16:10 | Toward Higher Power Density in GaN |
| Glen David Via, AFRL/RYDD, U.S.A. | ||
| 08 | 16:50 | European GaN for RF applications: Current Status and Trends |
| Guillaume Callet, Herve Blanck, Jan Grunenputt, Bernd Shauwecker, Benoit Lambert, Zineb Ouarch, Marc Camiade, Philippe Sin, Pierre-Franck Alleaume, UMS, FRANCE |
WS1D Recent Advances in Microwave Filters
Room
Room D (Shirakashi 2)
Date and Time
2014/11/4 (Tue) 10:30-13:30 (Half day)
Organizers
Zhewang Ma, Saitama Univ., JAPAN
Masataka Ohira, Saitama Univ., JAPAN
Abstract
Microwave filters are of significant importance in modern communication systems. This workshop is aimed at providing topics on recent progress in the research and development of RF/microwave filters, with emphasis on filters having tunable/reconfigurable functions, low loss, high rejection, steep transition between passband and stopband, and wide stopband. The first talk focuses on the development of miniature RF filters using liquid crystal polymer (LCP) multilayer circuit technology and electronically reconfigurable RF planar filters based on the integration of active tuning/switching elements onto planar filtering structures. The second talk presents four novel methods to design compact microstrip bandpass filters with wide stopbands. In the third talk, a simple and straightforward parameter-extraction method for transversal resonator array filters are introduced in order to design multi-mode planar bandpass filters with transmission zeros. The final talk describes the development of transmitting/receiving high-Tc superconducting (HTS) ultra-narrowband bandpass filters and their applications.
Time Table
| 01 | 10:30 | Miniature and Reconfigurable Microwave Planar Filters |
|---|---|---|
| Jiasheng Hong, Heriot-Watt Univ., U.K. | ||
| 02 | 11:10 | Design of Compact Microstrip Bandpass Filters with Wide Stopband |
| Ching-Wen Tang, National Chung Cheng Univ., TAIWAN | ||
| 11:50 | Break | |
| 03 | 12:10 | A Parameter-Extraction Method for Transversal Resonator Array Bandpass Filters and Its Applications to Multi-Mode Filter Designs |
| Masataka Ohira, Saitama Univ., JAPAN | ||
| 04 | 12:50 | Transmitting / Receiving Superconducting Filters for Wireless Applications |
| Hiroyuki Kayano, Toshiba Corp., JAPAN |
WS2D Biomedical Effects and Applications : from Microwaves to Millimeter-Waves
Room
Room D (Shirakashi 2)
Date and Time
2014/11/4 (Tue) 14:30-17:40 (Half day)
Organizers
Olga Boric-Lubecke, Univ. of Hawaii at Manoa, U.S.A.
Victor Lubecke, Univ. of Hawaii at Manoa, U.S.A.
Sponsorship
Endorsed by MTT TCC-20 and Endorsement Pending from MTT TCC-10
Abstract
This workshop will explore recent findings and advances in understanding the effects of electromagnetic waves on human tissue, and the use of microwave technology in medical imaging and diagnostics. The topics will includE RF Aspects of MRI, microwave and millimeter wave diagnostics, wireless vital signs monitoring and localization, and implantable wireless devices.
Time Table
| 01 | 14:30 | RF Aspects of Magnetic Resonance Imaging |
|---|---|---|
| Robert. H. Caverly, Villanova Univ., U.S.A. | ||
| 02 | 15:10 | RF/Microwave Indoor Human-Aware Localization |
| Changzhi Li, Texas Tech Univ., U.S.A. | ||
| 03 | 16:10 | Microwave and Millimeter-Wave Diagnostics |
| Yoshio Nikawa, Kokushikan Univ., JAPAN | ||
| 04 | 16:40 | A Wearable Radar Badge for Vital Sign Detection, Wireless Positioning and Wireless Data Transmission |
| Sheng-Fuh Chang, National Chung Cheng Univ., TAIWAN | ||
| 05 | 17:10 | Implantable Wireless Devices for Endoluminal Sensing and Treatment Applications |
| J.C. Chiao, Univ. of Texas, U.S.A. |