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Workshop Program
Workshop
B [ Active Circuit ]
Workshop 09
Nov. 29 (Fri) 09:00-11:30 Annex Hall F203
Recent Trend of Millimeter-Wave and Terahertz Electronics
Organizer / Chair : Minoru Fujishima (Hiroshima Univ.)
Millimeter-wave and terahertz allocated between radio wave and light is recognized as prospective frequency band to be utilized in future. Since the speed of recent electron devices has been increased rapidly, this emerging frequency band has been actively explored for realizing emerging applications such as high-speed communication and sensing like radars.
This workshop introduces recent progress of ultrahigh-frequency electronics producing breakthroughs in electronics.
Keyword : Millimeter Wave, Terahertz, Wireless Communication, Sensor, Radar
This workshop introduces recent progress of ultrahigh-frequency electronics producing breakthroughs in electronics.
Keyword : Millimeter Wave, Terahertz, Wireless Communication, Sensor, Radar
- 1Present and Future of Millimeter- and Terahertz-Wave Technologies
- Tadao Nagatsuma (Osaka Univ.)
- 2Semiconductor Technology and Its Challenges for Millimeter-Wave Applications
- Yuu Watanabe (Denso Corp.)
- 360GHz CMOS Transceiver for 300Gb/s Wireless Communication
- Kenichi Okada (Tokyo Institute of Technology)
B [ Active Circuit ]
Workshop 10
Nov. 29 (Fri) 09:00-11:30 Annex Hall F204
Recent Progress in Digitally Assisted RF Systems and Circuits for Advanced Wireless Systems
Organizers : Kenjiro Nishikawa (Kagoshima Univ.)Chair : Munenari Kawashima (NTT Corp.)
This session focuses on digitally-assist technologies to improve or compensate wireless communication systems. Digital pre-distorter techniques on base stations, digital technologies for frequency sensing, and digitally-assisted AD converters will be presented. The session will also address the future integration of digital technologies into wireless systems.
Keyword : Digital Pre-Distortion, Base Station, Frequency Sensing, AD Converter, Digital Assist
Keyword : Digital Pre-Distortion, Base Station, Frequency Sensing, AD Converter, Digital Assist
- 1Base Station Digital Predistorter Compensating Frequency-Dependent IMD Components
- Yasunori Suzuki, Junya Ohkawara, Shinji Mizuta, Shoichi Narahashi (NTT DOCOMO INC.)
- 2Highly-Sensitive Frequency Sensors with Digital Technologies
- Yo Yamaguchi, Takayuki Yamada, Hiroyuki Shiba, Takana Kaho, Tadao Nakagawa (NTT Corp.)
- 3Technology Trend of Digitally-Assisted AD Converters
- Kenichi Ohata (Kagoshima Univ.)
A [ Passive Circuit, Antennas ]
Workshop 11
Nov. 29 (Fri) 13:30-16:00 Annex Hall F203
Creation and Design of New Microwave Filters beyond the Classical Filter Theory
Organizers : Masataka Ohira (Saitama Univ.)Chair : Hiroyuki Kayano (Toshiba Corp.)
In recent years, as the spectrum resources are getting scarce, microwave filter designs become complicated to achieve high performance responses. Therefore, electromagnetic (EM) simulators are now indispensable for such filter designs, but the high performance filters cannot be realized only by EM simulations. The essence of microwave filter designs is the circuit theory and the network synthesis method, and thus the establishment of a new design theory is required for the creation of new microwave filters.
This workshop focuses on the latest design theory and circuital approaches beyond the classical filter theory, and also introduces the applications of the design theory to ultra-narrow bandpass filters, unbalanced-balanced filters, and multi-mode filters.
Keyword : Microwave Filters, High-Temperature Superconductor Filters, Unbalanced-Balanced Filters, Multi-Mode Filters
This workshop focuses on the latest design theory and circuital approaches beyond the classical filter theory, and also introduces the applications of the design theory to ultra-narrow bandpass filters, unbalanced-balanced filters, and multi-mode filters.
Keyword : Microwave Filters, High-Temperature Superconductor Filters, Unbalanced-Balanced Filters, Multi-Mode Filters
- 1Research and Development of Microwave Narrowband HTS Bandpass Filter for Weather Radar Systems
- Tamio Kawaguchi, Noritsugu Shiokawa, Kohei Nakayama, Mutsuki Yamazaki, Hiroyuki Kayano (Toshiba Corp.)
- 2Design of Unbalanced-Balanced Filter Using Hybrid Resonators Based on CRLH-TL Concept
- Masaya Tamura (Panasonic Co., Ltd.), Yang Tao, Tatsuo Itoh (UCLA)
- 3A Parameter-Extraction Method for Microwave Transversal Resonator Array Filters
and Its Applications to Multi-Mode Filter Designs - Masataka Ohira, Hiroyuki Aoyama, Zhewang Ma (Saitama Univ.)
B [ Active Circuit ]
Workshop 12
Nov. 29 (Fri) 13:30-16:00 Annex Hall F204
Smart Microwave Amplifiers with Reconfigurability / Adaptability
Organizers : Hiromitsu Uchida (Mitsubishi Electric Corp.)Chair : Yasushi Itoh (Shonan Institute of Technology)
A growing attention is paid to reconfigurability and adaptability in recent communication systems, where an extremely rapid growth of traffic has to be dealt with, and some buzzwords such as traffic offload, carrier aggregation, multimode/multiband, cognitive radio, and so on, are highly noticed.
This workshop presents, as the key devices for the systems, "smart" amplifiers which can cope with different frequencies or with wide range of power level.
Keyword : Amplifier, Adaptability, Reconfigurability, Power, Frequency
This workshop presents, as the key devices for the systems, "smart" amplifiers which can cope with different frequencies or with wide range of power level.
Keyword : Amplifier, Adaptability, Reconfigurability, Power, Frequency
- 1Circuit Configurations of Microwave Doherty Power Amplifiers
- Yoichiro Takayama, Kazuhiko Honjo (The Univ. of Electro-Communications)
- 2Band-Switchable Multi-Band Power Amplifier
- Atsushi Fukuda, Takayuki Furuta, Hiroshi Okazaki, Shoichi Narahashi (NTT DOCOMO, INC.)
- 3Path-Switchable Power Amplifier for Mobile Terminal
- Shintaro Shinjo, Katsuya Kato, Kenichi Horiguchi, Morishige Hieda (Mitsubishi Electric Corp.)
- 4Reconfigurable Low-Noise Amplifiers
- Yasushi Itoh (Shonan Institute of Technology)
C [ Measurement Techniques ]
Workshop 13
Nov. 29 (Fri) 13:00-14:30 Exhibition Hall D - Workshop Space
New RF Measurement and Test Technologies Supported by
Digital Assist -Impact on "Mono-Zukuri"-<
Organizer / Chair : Masayuki Kimishima (Advantest Laboratories Ltd..)
With the tide of the large scale RF circuit design, main object of the design and evaluation of RF circuits has been shifting from discrete circuits to LSI. According to this trend, the roles of digital assist are becoming important for RF measurement and test.
This session discuss the proposals and impacts of the new RF measurements and Test technologies.
Keyword : Spectrum Measurement, Sampling, Built-In Test, RF Measurement, Power Amplifier, FPGA
This session discuss the proposals and impacts of the new RF measurements and Test technologies.
Keyword : Spectrum Measurement, Sampling, Built-In Test, RF Measurement, Power Amplifier, FPGA
- 1On-die Front-end Circuits for Measuring Spectrum in VLSI Circuits
- Takahiro Yamaguchi (Advantest Laboratories Ltd.)
- 2RF Measurement Techniques Using FPGA in Wireless Communication Industry
and Applications for Mixed RF-Digital Circuits - Kazuya Takigawa, Kazunari Okada (National Instruments Japan Corp.)
C [ Measurement Techniques ]
Workshop 14
Nov. 29 (Fri) 15:00-16:30 Exhibition Hall D - Workshop Space
The Latest Method to Realize Accurate S-Parameter Measurement
Using the Test Fixture and the Probe
Organizers : Osamu Tsujii (Agilent Technologies Japan, Ltd.)Chair : Tadashi Kawai (Univ. of Hyogo)
In the actual measurement situation, there are many cases which need the test fixture and the probe to the DUT. In such cases, how to compensate the measurement error from the calibration plane is a problem.
In this session, the latest compensation method will be discussed to realize accurate S-parameter measurement.
Keyword : S-parameter, Calibration, Compensation, Test Fixture, Probe
In this session, the latest compensation method will be discussed to realize accurate S-parameter measurement.
Keyword : S-parameter, Calibration, Compensation, Test Fixture, Probe
- 1S-Parameter Measurement Method at Non-Coaxial Device Interface
- Kanna Ibe (Rohde & Schwartz Japan.)
- 2Compensation Method of the Test Fixture to Realize Accurate S-Parameter Measurement
- Osamu Tsujii (Agilent Technologies Japan, Ltd.)