Modeling and characterization of next generation RF and microwave devices at wafer-level has introduced new challenges to the measurement system. The need for accurate and high-speed waferlevel RF test of single-ended, multiport, and differential components demands outstanding performance from measurement systems and accessories.
As a solution, SUSS MicroTec provides a complete wafer-level RF and microwave measurement and characterization system. An important part of the system is SussCalR® calibration software with the LRM+™ calibration method, the most accurate method as verified using NIST standards. Further development of SUSS calibration and measurement methodology resulted in powerful, new tools such as SussCert™ and AccuraCV™, for addressing test engineer’s needs for confident S-parameter and impedance measurement in a broadband frequency range. Additionally, the unique work-flow concept, integrated assistants and wizards significantly reduces calibration set-up complexity and start-up time.
This comprehensive solution from SUSS brings engineers to a totally new level of modeling, design and fabrication of the next generation of RF and microwave components.
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