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Workshop Program
Workshop 09-13
D [ Systems ]
Workshop 09
Dec. 12 (Fri) 09:00-11:30 Room 1 (Annex Hall F201+F202)
Millimeter-Wave Broadband Communications
Organizers / Chair : Kenichi Okada, Tokyo Inst. of Tech.
Commercial use of millimeter-wave and terahertz allocated between
radio wave and light is widely expected. This session focuses on the
recent development of WiGig IC using the 60-GHz carrier frequency
as well as the future perspective of terahertz technologies. Three
exciting leading-edge researchers will introduce the millimeter-wave
and terahertz technologies.
Keyword ： WiGig, Wi-Fi, 60GHz, Millimeter-wave, Teraherz, Wireless Communication
Keyword ： WiGig, Wi-Fi, 60GHz, Millimeter-wave, Teraherz, Wireless Communication
- 1Circuits and Architectures for 60GHz Transceivers
- Michael Boers¹², Leonard Hall², Anthony Parker², Neil Weste²³,
¹Broadcom, ²Macquarie University, ³NHEW R&D Pty Ltd
- 260GHz Short-Range Wireless Technologies for Multi-Gigabit Systems
- Koji Takinami, Naganori Shirakata, Panasonic
- 3Terahertz Wireless Communications : Recent Progress and Future Perspective
- Ho-Jin Song, Takuro Tajima, Makoto Yaita, NTT Device Tech. Lab.
A [ Passive Circuit, Antennas ]
Workshop 10
Dec. 12 (Fri) 09:00-11:30 Room 2 (Annex Hall F203)
Metamaterial Antennas
Organizers : Atsushi Sanada, Yamaguchi Univ., Naobumi Michishita, National Defense AcademyChair : Naobumi Michishita, National Defense Academy
Researches on metamaterial antennas with unique characteristics that
cannot be achieved by conventional antenna technologies have
extensively been carried out. This workshop focuses on recent
progress of metamaterial antennas technologies such as counter
circularly polarized radiation from metamaterial antennas, practical
electromagnetic analysis methods, traveling-wave-resonator
antennas, and electrically small antennas.
Keyword ： Metamaterials, Antennas, Counter Circularly Polarized Antennas, Electromagnetic Analyses, Traveling-Wave-Resonator Antennas, Electrically Small Antennas
Keyword ： Metamaterials, Antennas, Counter Circularly Polarized Antennas, Electromagnetic Analyses, Traveling-Wave-Resonator Antennas, Electrically Small Antennas
- 1Counter Circularly Polarized Radiation from Metamaterial Antennas
- Hisamatsu Nakano, Kenta Yoshida, Junji Yamauchi, Hosei Univ.
- 2Computational Methods for Design of Metamaterial Antennas
- Toru Uno, Tokyo Univ. of Agriculture and Tech.
- 3Metamaterial Pseudo-Traveling Wave Resonant Antenna
- Tetsuya Ueda, Kyoto Inst. of Tech.
- 4Metamaterial Electrically Small Antennas
- Naobumi Michishita, National Defense Academy
D [ Systems ]
Workshop 11
Dec. 12 (Fri) 13:30-16:00 Room 1 (Annex Hall F201+F202)
Recent Progress in Terahertz Technologies and Its Applications
Organizers / Chair : Takuro Tajima, NTT Device Tech. Lab.
Terahertz waves, which are located between millimeter waves and
infrared light, have gathered great attention as an emerging frequency
band. Utilizing THz waves, various applications have been
attempted, such as wireless communication, bio-sensing, nondestructive
testing, and so on. In this workshop, the recent progress in
these applications will be presented with its newly developed
systems.
Keyword ： Terahertz, Wireless, Biomedical, Sensing, Nondestructive Testing, Imaging, Analysis System
Keyword ： Terahertz, Wireless, Biomedical, Sensing, Nondestructive Testing, Imaging, Analysis System
- 1Terahertz Wireless Communications Using Electronic Devices
- Safumi Suzuki, Masahiro Asada, Tokyo Inst. of Tech.
- 2Terahertz Technology for Bio-Sensing Applications
- Yuichi Ogawa, Kyoto Univ.
- 3Nondestructive Testing by Using THz Pulse Technique in Practice
- Kaori Fukunaga¹，Takahide Sakagami², Norikazu Fuse², Tetsuo Fukuchi³,
¹NICT, ²Kobe Univ., ³CRIEPI
- 4The Newest Terahertz Analysis System and Applications
- Shusaku Sato，Akiyoshi Irisawa, Motoki Imamura, Advantest Corp.
C [ Measurement Techniques ]
Workshop 12
Dec. 12 (Fri) 13:00-14:30 Room 4 (Exhibition Hall Workshop Space)
High Frequency Measurement Techniques for Dielectric and Circuit Board Characteristics
−Requirements of Accurate Measurement Techniques from RF to Millimeterwave Frequencies−
Organizers / Chair : Masahiro Horibe, AIST, Osamu Tsujii, Keysight Technologies, Inc.
Accurate high frequency measurements impact to the research and
development (R&D) of leading edge electronic products. It is
required in R&D ranging from materials to final products. Major and
fundamental techniques of this type of measurements used in R&D
stage must be a vector network analyzer measurement. This
workshop will present requirements of measurement conditions and
performances for material characterizations and planer circuit
measurements
Keyword ： Plaer Circuits, Dielectric Measurements, Vector Network Analyzers, TDR
Keyword ： Plaer Circuits, Dielectric Measurements, Vector Network Analyzers, TDR
- 1Workshop Overview and Report of APMP Workshop: Microwave Measurements
- Masahiro Horibe, AIST
- 2Application of Broadband Vector Network Analyzer −Broadband Measurement (70kHz-145GHz)−
- Kazuyoshi Suzuki, Anritsu Corp.
- 3Fixture Compensation and Differential Measurement of Network Analyzer
- Yusuke Kato, Rohde & Schwarz Japan K.K.
- 4Benefits of TDR Measurements with Network Analyzers
- Shuichi Manabe, Keysight Technologies, Inc.
C [ Measurement Techniques ]
Workshop 13
Dec. 12 (Fri) 15:00-16:30 Room 4 (Exhibition Hall Workshop Space)
Materials Evaluation Techniques in Circuit Design and Circuit Board Development You Need to Know
Organizers/ Chair : Takashi Shimizu, Utsunomiya Univ., Masahiro Horibe, AIST
Information electronics devices have been used widely in all life
situations. Requirements of performance and characteristics for
circuit-board depending on usage environments are different.
Therefore, various dielectric materials such as ceramics and resin have been developed for electronic materials. In this session, the dielectric properties and its evaluation techniques will be presented for circuit designs and substrate developments. Furthermore, technical trends of dielectric measurements in abroad will be introduced.
Keyword ： Material Evaluation Technique, Complex Permittivity, Surface Resistance, Circuit Design, Circuit Board Development
Therefore, various dielectric materials such as ceramics and resin have been developed for electronic materials. In this session, the dielectric properties and its evaluation techniques will be presented for circuit designs and substrate developments. Furthermore, technical trends of dielectric measurements in abroad will be introduced.
Keyword ： Material Evaluation Technique, Complex Permittivity, Surface Resistance, Circuit Design, Circuit Board Development
- 1Summary Report for APMC2014 Workshop : Material Characterization
- Masahiro Horibe, AIST
- 2Microwave and Millimeter-Wave Measurement Techniques for Dielectrics and Circuit Substrates
- Yoshio Kobayashi, SUMTEC, Inc.
- 3Evaluation Techniques of Dielectric Materials for Microwave and Millimeter Wave Applications
−Complex Permittivity in the Horizontal Direction− - Takashi Shimizu, Utsunomiya Univ.